In the field of organic electronics (OLED and OPV), industrial R&D is still dominated by time-consuming and costly experimental trial&error approaches. Using SimStack, a bottom up multiscale modeling workflow is implemented that allows the prediction of device properties without the use of external parameters, e.g. from experiment. By combining four methods acting on different time and length scales, material developers and device manufacturers can identify microscopic bottlenecks in device performance, fully in the computer.
Check the Nanomatch Homepage for further information.
You can find more use cases here.